25‐1: Invited Paper: Achieving high uniformity and yield of 200 mm GaN‐on‐Si LED epiwafers for micro LED applications with precise strain‐engineering
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Eric H. Virey, Nicolas Baron
Ajit Paranjpe, Jay Montgomery, Soo Min Lee et al.
- Published
- May 29, 2019
- Vol/Issue
- 50(1)
- Pages
- 338-341
- License
- View
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