Global sensitivity analysis of wheat grain yield and quality and the related process variables from the DSSAT-CERES model based on the extended Fourier Amplitude Sensitivity Test method
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J.W Jones, G Hoogenboom, C.H Porter et al.
Taru Palosuo, Kurt Christian Kersebaum, Carlos Angulo et al.
Matthew Reynolds, JOHN FOULKES, Robert Furbank et al.
A. Saltelli, S. Tarantola, K. P.-S. Chan
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Yu Tian, Cunzhen Pan · 2026
Xuening Yang, Xuanze Zhang · 2025
- Published
- Jul 01, 2019
- Vol/Issue
- 18(7)
- Pages
- 1547-1561
- License
- View
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