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Global sensitivity analysis of wheat grain yield and quality and the related process variables from the DSSAT-CERES model based on the extended Fourier Amplitude Sensitivity Test method

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Published
Jul 01, 2019
Vol/Issue
18(7)
Pages
1547-1561
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Zhen-hai LI, Xiu-liang JIN, Hai-long LIU, et al. (2019). Global sensitivity analysis of wheat grain yield and quality and the related process variables from the DSSAT-CERES model based on the extended Fourier Amplitude Sensitivity Test method. Journal of Integrative Agriculture, 18(7), 1547-1561. https://doi.org/10.1016/s2095-3119(18)62046-5