Probing Long- and Short-Range Disorder in Y2Ti2–xHfxO7 by Diffraction and Spectroscopy Techniques

Maxim Avdeev; Massey de los Reyes; Gregory R. Lumpkin; Brendan J. Kennedy; Peter E. R. Blanchard; Shuna Liu; Anton Tadich; Bruce C. C. Cowie

doi:10.1021/acs.jpcc.6b07076

journal article Nov 15, 2016

Probing Long- and Short-Range Disorder in Y2Ti2–xHfxO7 by Diffraction and Spectroscopy Techniques

Maxim Avdeev

Massey de los Reyes Gregory R. Lumpkin Brendan J. Kennedy

Peter E. R. Blanchard Shuna Liu Anton Tadich

Bruce C. C. Cowie

The Journal of Physical Chemistry C Vol. 120 No. 46 pp. 26465-26479 · American Chemical Society (ACS)

View at Publisher Save 10.1021/acs.jpcc.6b07076

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References

Details

Published: Nov 15, 2016
Vol/Issue: 120(46)
Pages: 26465-26479

Authors

M

Maxim Avdeev

Australian Nuclear Science and Technology Organisation, Lucas Heights, New South Wales 2234, Australia

M

Massey de los Reyes

Australian Nuclear Science and Technology Organisation, Lucas Heights, New South Wales 2234, Australia

G

Gregory R. Lumpkin

Australian Nuclear Science and Technology Organisation, Lucas Heights, New South Wales 2234, Australia

B

Brendan J. Kennedy

School of Chemistry, The University of Sydney, Sydney, New South Wales 2006, Australia

P

Peter E. R. Blanchard

School of Chemistry, The University of Sydney, Sydney, New South Wales 2006, Australia

S

Shuna Liu

School of Chemistry, The University of Sydney, Sydney, New South Wales 2006, Australia

A

Anton Tadich

Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia

B

Bruce C. C. Cowie

Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia

Funding

Australian Research Council

Cite This Article

Maxim Avdeev, Massey de los Reyes, Gregory R. Lumpkin, et al. (2016). Probing Long- and Short-Range Disorder in Y2Ti2–xHfxO7 by Diffraction and Spectroscopy Techniques. The Journal of Physical Chemistry C, 120(46), 26465-26479. https://doi.org/10.1021/acs.jpcc.6b07076

Probing Long- and Short-Range Disorder in Y2Ti2–xHfxO7 by Diffraction and Spectroscopy Techniques

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