Cation Composition-Dependent Device Performance and Positive Bias Instability of Self-Aligned Oxide Semiconductor Thin-Film Transistors: Including Oxygen and Hydrogen Effect

Jun Tae Jang; Donguk Kim; Ju Heyuck Baeck; Jong Uk Bae; Jiyong Noh; Seok-Woo Lee; Kwon-Shik Park; Jeom Jae Kim; Soo Young Yoon; Changwook Kim; Yong-Sung Kim; Saeroonter Oh; Dae Hwan Kim

doi:10.1021/acsami.1c18890

journal article Jan 03, 2022

Cation Composition-Dependent Device Performance and Positive Bias Instability of Self-Aligned Oxide Semiconductor Thin-Film Transistors: Including Oxygen and Hydrogen Effect

Jun Tae Jang Donguk Kim

Ju Heyuck Baeck Jong Uk Bae Jiyong Noh Seok-Woo Lee

Kwon-Shik Park Jeom Jae Kim Soo Young Yoon Changwook Kim

Yong-Sung Kim

Saeroonter Oh

Dae Hwan Kim

ACS Applied Materials & Interfaces Vol. 14 No. 1 pp. 1389-1396 · American Chemical Society (ACS)

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Details

Published: Jan 03, 2022
Vol/Issue: 14(1)
Pages: 1389-1396
License: View

Authors

J

Jun Tae Jang

School of Electrical Engineering, Kookmin University, Seoul 02707, Republic of Korea

D

Donguk Kim

School of Electrical Engineering, Kookmin University, Seoul 02707, Republic of Korea

J

Ju Heyuck Baeck