In Situ Neutron Reflectometry Study of Solid Electrolyte Interface (SEI) Formation on Tungsten Thin-Film Electrodes

Eric D. Rus; Joseph A. Dura

doi:10.1021/acsami.9b16592

journal article Dec 09, 2019

In Situ Neutron Reflectometry Study of Solid Electrolyte Interface (SEI) Formation on Tungsten Thin-Film Electrodes

Eric D. Rus

Joseph A. Dura

ACS Applied Materials & Interfaces Vol. 11 No. 50 pp. 47553-47563 · American Chemical Society (ACS)

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Metrics

38

Citations

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References

Details

Published: Dec 09, 2019
Vol/Issue: 11(50)
Pages: 47553-47563
License: View

Authors

E

Eric D. Rus

NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

J

Joseph A. Dura

NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

Funding

National Institute of Standards and Technology

National Research Council

Cite This Article

Eric D. Rus, Joseph A. Dura (2019). In Situ Neutron Reflectometry Study of Solid Electrolyte Interface (SEI) Formation on Tungsten Thin-Film Electrodes. ACS Applied Materials & Interfaces, 11(50), 47553-47563. https://doi.org/10.1021/acsami.9b16592

In Situ Neutron Reflectometry Study of Solid Electrolyte Interface (SEI) Formation on Tungsten Thin-Film Electrodes

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