In Situ
                    Conductance Monitoring of Electrochemical Reduced Graphene Oxide Film Formation on Microstructured Electrodes

Laurin Hastreiter; Thomas Hirsch

doi:10.1021/acselectrochem.5c00543

journal article Open Access Jan 26, 2026

In Situ Conductance Monitoring of Electrochemical Reduced Graphene Oxide Film Formation on Microstructured Electrodes

Laurin Hastreiter

Thomas Hirsch

ACS Electrochemistry Vol. 2 No. 2 pp. 554-565 · American Chemical Society (ACS)

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Details

Published: Jan 26, 2026
Vol/Issue: 2(2)
Pages: 554-565
License: View

Authors

L

Laurin Hastreiter

Institute of Analytical Chemistry, Chemo- and Biosensors; University of Regensburg

T

Thomas Hirsch

Institute of Analytical Chemistry, Chemo- and Biosensors; University of Regensburg

Funding

Deutsche Forschungsgemeinschaft Award: HI 1783/8-1

Cite This Article

Laurin Hastreiter, Thomas Hirsch (2026). In Situ Conductance Monitoring of Electrochemical Reduced Graphene Oxide Film Formation on Microstructured Electrodes. ACS Electrochemistry, 2(2), 554-565. https://doi.org/10.1021/acselectrochem.5c00543

In Situ Conductance Monitoring of Electrochemical Reduced Graphene Oxide Film Formation on Microstructured Electrodes

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