True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

Saima A. Sumaiya; Jun Liu; Mehmet Z. Baykara

doi:10.1021/acsnano.2c08321

journal article Oct 25, 2022

True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

Saima A. Sumaiya Jun Liu

Mehmet Z. Baykara

ACS Nano Vol. 16 No. 12 pp. 20086-20093 · American Chemical Society (ACS)

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References

Details

Published: Oct 25, 2022
Vol/Issue: 16(12)
Pages: 20086-20093
License: View

Authors

S

Saima A. Sumaiya

Department of Mechanical Engineering, University of California Merced, Merced, California95343United States

J

Jun Liu

University of Michigan

M

Mehmet Z. Baykara

Department of Mechanical Engineering, University of California Merced, Merced, California95343United States

Funding

U.S. Department of Defense Award: FA9550-19-1-0035

Cite This Article

Saima A. Sumaiya, Jun Liu, Mehmet Z. Baykara (2022). True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy. ACS Nano, 16(12), 20086-20093. https://doi.org/10.1021/acsnano.2c08321

True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

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