Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS
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Saeid Farhadi, Zeinab Roostaei-Zaniyani
D. A. Shirley
B. Ravel, M. Newville
A. L. Patterson
A.S. Boyarchenkov, S.I. Potashnikov, K.A. Nekrasov et al.
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- Published
- Nov 30, 2012
- Vol/Issue
- 24(23)
- Pages
- 4483-4490
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