journal article Nov 30, 2012

Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS

View at Publisher Save 10.1021/cm300739y
Topics

No keywords indexed for this article. Browse by subject →

References
79
[1]
Rastogi R. P. Indian J. Eng. Mater. Sci. (2010)
[2]
Anspoks A. J. Non-Cryst. Solids (2011) 10.1016/j.jnoncrysol.2011.02.030
[3]
Hosny N. M. Polyhedron (2011) 10.1016/j.poly.2010.11.020
[4]
Klabunde K. J. Langmuir (2002) 10.1021/la010701p
[5]
Kadoma R. H. Phys. Rev. Lett. (1997) 10.1103/physrevlett.79.1393
[6]
Boschloo G. J. Phys. Chem. B (2001) 10.1021/jp003499s
[7]
Gonzalez-Calbet J. M. Chem. Mater. (2010) 10.1021/cm1017823
[8]
Dong H. L. Energy Fuels (2008) 10.1021/ef700283j
[9]
Shah M. A. Nanoscale Res. Lett. (2008) 10.1007/s11671-008-9147-z
[10]
Meneses C. T. J. Nanopart. Res. (2007) 10.1007/s11051-006-9109-2
[11]
Wang F. H. Powder Technol. (2004) 10.1016/j.powtec.2004.09.024
[12]
Peck M. A. J. Appl. Phys. (2011)
[13]
Mishra S. K. Int. J. Mod. Phys. B (2011) 10.1142/s0217979211100035
[14]
Gandhi S. J. Appl. Polym. Sci. (2010) 10.1002/app.32570
[15]
Plashnitsa V. V. Electrochim. Acta (2010) 10.1016/j.electacta.2010.06.084
[17]
Wang J. Rev. Sci. Instrum. (2008) 10.1063/1.2969260
[18]
Lee P. L. J. Synchrotron Radiat. (2008) 10.1107/s0909049508018438
[19]
Preissner C. Nucl. Instrum. Methods Phys. Res., Sect. A (2007) 10.1016/j.nima.2007.08.097
[20]
Dalesio L. R. Nucl. Instrum. Methods Phys. Res., Sect. A (2008) 10.1016/0168-9002(94)91493-1
[21]
Rodríguez-Carvajal, J.FULLPROF: A Program for Rietveld Refinement and Pattern Matching Analysis. Presented at theSatellite Meeting on Powder Diffraction of the XV IUCr Congress, 1990; Paper No. 127.
[22]
Furstenau R. P. Surf. Sci. (1985) 10.1016/0039-6028(85)90107-4
[23]
XPSPeak4.1 is a freeware fitting program developed by R. Kwok,http://www.phy.cuhk.edu.hk/∼surface/download.html
[24]
High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold

D. A. Shirley

Physical Review B 1972 10.1103/physrevb.5.4709
[25]
Newville M. Fundamentals of XAFS (2004)
[26]
ATHENA,ARTEMIS,HEPHAESTUS: data analysis for X-ray absorption spectroscopy usingIFEFFIT

B. Ravel, M. Newville

Journal of Synchrotron Radiation 2005 10.1107/s0909049505012719
[27]
The Scherrer Formula for X-Ray Particle Size Determination

A. L. Patterson

Physical Review 1939 10.1103/physrev.56.978
[28]
Wang J. X. J. Am. Chem. Soc. (2010) 10.1021/ja204518x
[29]
Borogohain K. Phys. Rev. B (2000) 10.1103/physrevb.61.11093
[30]
Ahmad M. I. Appl. Phys. Lett. (2009) 10.1063/1.3261754
[31]
Swamy V. Appl. Phys. Lett. (2006) 10.1063/1.2213956
[32]
Zhang F. Appl. Phys. Lett. (2002) 10.1063/1.1430502
[33]
Tsunekawa S. Appl. Phys. Lett. (2004) 10.1063/1.1811771
[34]
Manjon F. J. J. Appl. Phys. (2009) 10.1063/1.3116727
[35]
Tsunekawa S. Phys. Rev. Lett. (2000) 10.1103/physrevlett.85.3440
[36]
Kuznetsov A. Y. Appl. Phys. Lett. (2009) 10.1063/1.3139078
[37]
Kremenovic A. J. Phys. Chem. C (2012) 10.1021/jp206658v
[38]
Perebeinos V. Solid State Commun. (2002) 10.1016/s0038-1098(02)00266-1
[39]
Molecular dynamics simulation of UO2 nanocrystals surface

A.S. Boyarchenkov, S.I. Potashnikov, K.A. Nekrasov et al.

Journal of Nuclear Materials 2012 10.1016/j.jnucmat.2011.11.030
[40]
Demortiere A. Nanoscale (2011) 10.1039/c0nr00521e
[41]
Venkatatoswara R. K. J. Nanosci. Nanotechnol. (2008)
[42]
Bartel L. C. Phys. Rev. B (1971) 10.1103/physrevb.3.1039
[43]
Chhaganala G. A. Nanoscale Res. Lett. (2011) 10.1186/1556-276x-6-485
[44]
Mironova-Ulmane N. Diffus. Defect Data, Pt. B (2011)
[45]
Liu Y. X. Solid State Commun. (2002) 10.1016/s0038-1098(02)00006-6
[46]
Zhang X. J. Solid State Electrochem. (2009) 10.1007/s10008-008-0587-2
[47]
Luo P. Physica B (2010) 10.1016/j.physb.2010.04.063
[48]
Ochanda F. Langmuir (2005) 10.1021/la050911s
[49]
Hu H. Appl. Surf. Sci. (2006) 10.1016/j.apsusc.2005.11.060
[50]
Ariosa D. J. Appl. Phys. (2011) 10.1063/1.3669026

Showing 50 of 79 references

Metrics
793
Citations
79
References
Details
Published
Nov 30, 2012
Vol/Issue
24(23)
Pages
4483-4490
Cite This Article
Matthea A. Peck, Marjorie A. Langell (2012). Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS. Chemistry of Materials, 24(23), 4483-4490. https://doi.org/10.1021/cm300739y
Related

You May Also Like

Challenges for Rechargeable Li Batteries

John B. Goodenough, Youngsik Kim · 2009

10,393 citations

Ruddlesden–Popper Hybrid Lead Iodide Perovskite 2D Homologous Semiconductors

Constantinos C. Stoumpos, Duyen H. Cao · 2016

1,982 citations