journal article Feb 01, 2008

Scanning Electrochemical Microscopy. 59. Effect of Defects and Structure on Electron Transfer through Self-Assembled Monolayers

Langmuir Vol. 24 No. 6 pp. 2841-2849 · American Chemical Society (ACS)
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33
References
Details
Published
Feb 01, 2008
Vol/Issue
24(6)
Pages
2841-2849
Authors
Cite This Article
Abolfazl Kiani, Mario A. Alpuche-Aviles, Paul K. Eggers, et al. (2008). Scanning Electrochemical Microscopy. 59. Effect of Defects and Structure on Electron Transfer through Self-Assembled Monolayers. Langmuir, 24(6), 2841-2849. https://doi.org/10.1021/la702811t
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