Effect of Tip Size on Force Measurement in Atomic Force Microscopy

Leonard T. W. Lim; Andrew T. S. Wee; Sean J. O'Shea

doi:10.1021/la703231h

journal article Feb 12, 2008

Effect of Tip Size on Force Measurement in Atomic Force Microscopy

Leonard T. W. Lim Andrew T. S. Wee

Sean J. O'Shea

Langmuir Vol. 24 No. 6 pp. 2271-2273 · American Chemical Society (ACS)

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References

Details

Published: Feb 12, 2008
Vol/Issue: 24(6)
Pages: 2271-2273

Authors

L

Leonard T. W. Lim

Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119620, and Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602

A

Andrew T. S. Wee

Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119620, and Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602

S

Sean J. O'Shea

Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119620, and Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602

Cite This Article

Leonard T. W. Lim, Andrew T. S. Wee, Sean J. O'Shea (2008). Effect of Tip Size on Force Measurement in Atomic Force Microscopy. Langmuir, 24(6), 2271-2273. https://doi.org/10.1021/la703231h

Effect of Tip Size on Force Measurement in Atomic Force Microscopy

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