journal article Mar 09, 2009

A Scanning Probe Microscopy Based Assay for Single-Walled Carbon Nanotube Metallicity

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A length dependence in dielectric polarization was observed for metallic nanotubes, which is discussed in a separate manuscript by W. Lu, Y. Xiong, and L. W. Chen, submitted for publication. On the basis of the results therein, SWNTs shorter than 200 nm are excluded from the data analysis for the metallicity assay. Since there is no evidence to support that either metallic or semiconducting SWNTs are more prone to breakage into small segments in solution processing or sample deposition, the assay results from tubes >200 nm in length should still reflect the M/S contents of the entire SWNT population in the sample.
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Details
Published
Mar 09, 2009
Vol/Issue
9(4)
Pages
1668-1672
Authors
Cite This Article
Wei Lu, Yao Xiong, Abdou Hassanien, et al. (2009). A Scanning Probe Microscopy Based Assay for Single-Walled Carbon Nanotube Metallicity. Nano Letters, 9(4), 1668-1672. https://doi.org/10.1021/nl900194j
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