Measurement of finite-frequency current statistics in a single-electron transistor
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Ya.M. Blanter, M. Büttiker
S. Gustavsson, R. Leturcq, M. Studer et al.
L. E. Fedichkin, T. B. Fakhrutdinov · 2025
- Published
- Jan 03, 2012
- Vol/Issue
- 3(1)
- License
- View
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