Low temperature near-field fingerprint spectroscopy of 2D electron systems in oxide heterostructures and beyond
Confined electron systems, such as 2D electron gases (2DEGs), 2D materials, or topological insulators, show great technological promise but their susceptibility to defects often results in nanoscale inhomogeneities with unclear origins. Scattering-type scanning near-field optical microscopy (s-SNOM) is useful to investigate buried confined electron systems non-destructively with nanoscale resolution, however, a clear separation of carrier concentration and mobility was so far impossible in s-SNOM. Here, we predict a previously inaccessible characteristic “fingerprint” response of the prototypical LaAlO3/SrTiO3 2DEG, and verify it using a state-of-the-art tunable narrow-band laser in mid-infrared cryo-s-SNOM at 8 K. Our modeling allows us to separate the influence of carrier concentration and mobility on fingerprint spectra and to characterize 2DEG inhomogeneities on the nanoscale. Finally, we model the surface accumulation layer in doped InAs, to show that our fingerprint spectra are a universal feature and generally applicable to confined electron systems, like topological insulators or stacked van-der-Waals materials.
No keywords indexed for this article. Browse by subject →
A. Ohtomo, H. Y. Hwang
Lu Li, C. RICHTER, J. Mannhart et al.
Showing 50 of 67 references
- Published
- May 13, 2025
- Vol/Issue
- 16(1)
- License
- View
You May Also Like
Yingyao Zhou, Bin Zhou · 2019
11,778 citations
Maksim Kunitski, Nicolas Eicke · 2019
7,922 citations
Kosuke Yoshihara, Maria Shahmoradgoli · 2013
7,687 citations
Suoqin Jin, Christian F. Guerrero-Juarez · 2021
6,760 citations
Atul Bhardwaj, Jatinder Kaur · 2017
6,689 citations