X-ray photoelectron spectroscopy of thin films

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Powell, C. J. Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in X-ray photoelectron spectroscopy. J. Vac. Sci. Technol. A 38, 023209 (2020). This important paper explains subtle differences between various terms frequently used in XPS jargon. 10.1116/1.5141079

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Published: May 25, 2023
Vol/Issue: 3(1)
License: View

Authors

Thin Film Physics Division; Department of Physics; Chemistry; and Biology (IFM); Linköping University

Cite This Article

Grzegorz Greczynski, Richard T. Haasch, Niklas Hellgren, et al. (2023). X-ray photoelectron spectroscopy of thin films. Nature Reviews Methods Primers, 3(1). https://doi.org/10.1038/s43586-023-00225-y

X-ray photoelectron spectroscopy of thin films

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