Measuring the orientation of a single CdSe/CdS nanocrystal at the end of a near-field tip for the realization of a versatile active SNOM probe
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K. H. Drexhage, H. Kuhn, F. P. Schäfer
- Published
- Jan 01, 2018
- Vol/Issue
- 20(24)
- Pages
- 16444-16448
- License
- View
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