Enhanced ferroelectric properties of Cr-doped BiFeO3 thin films grown by chemical solution deposition

Jong Kuk Kim; Sang Su Kim; Won-Jeong Kim; Amar S. Bhalla; Ruyan Guo

doi:10.1063/1.2189453

journal article Mar 27, 2006

Enhanced ferroelectric properties of Cr-doped BiFeO3 thin films grown by chemical solution deposition

Jong Kuk Kim Sang Su Kim Won-Jeong Kim Amar S. Bhalla Ruyan Guo

Applied Physics Letters Vol. 88 No. 13 · AIP Publishing

View at Publisher Save 10.1063/1.2189453

Abstract

Multiferroic Cr-doped BiFeO3 (BFO) thin films were prepared on Pt∕TiO2∕SiO2∕Si(100) substrates by a chemical solution deposition method. From the x-ray photoelectron spectroscopy measurements, it was observed that the valence number of Fe ion in undoped and Cr-doped BFO thin films was found to be almost 3+. It was found that Cr-doped BFO thin films exhibited good ferroelectric properties, such as improved leakage-current density and P-E hysteresis characteristics. The 3mol% Cr-doped BFO thin film showed a leakage-current density of 9.2×10−7A∕cm2 at 100kV∕cm and a large remanent polarization (Pr) of 61μC∕cm2 at room temperature.

Topics

No keywords indexed for this article. Browse by subject →

References

15

[1]

Science (2004)

[2]

Phys. Rev. B (2003) 10.1103/physrevb.67.180401

[3]

Solid State Commun. (1969) 10.1016/0038-1098(69)90597-3

[4]

Phys. Rev. B (2005) 10.1103/physrevb.71.014113

[5]

Appl. Phys. Lett. (2002) 10.1063/1.1458695

[6]

Appl. Phys. Lett. (2005) 10.1063/1.1862336

[7]

J. Appl. Phys. (2005) 10.1063/1.1881776

[8]

Science (2003) 10.1126/science.1080615

[9]

Appl. Phys. Lett. (2004) 10.1063/1.1799234

[10]

Appl. Phys. Lett. (2003) 10.1063/1.1626267

[11]

Jpn. J. Appl. Phys., Part 2 (2004) 10.1143/jjap.43.l647

[12]

J. Phys. Chem. B (2002) 10.1021/jp013170m

[13]

Ceram. Int. (2004) 10.1016/j.ceramint.2003.12.072

[14]

Phys. Rev. B (1995) 10.1103/physrevb.52.17449

[15]

Science (2005)

Cited By

235

Multiferroics and magnetoelectrics: thin films and nanostructures

L W Martin, S P Crane · 2008

Journal of Physics: Condensed Matte...

Metrics

235

Citations

15

References

Details

Published: Mar 27, 2006
Vol/Issue: 88(13)

Authors

J

Jong Kuk Kim

Changwon National University Department of Physics, , Changwon Kyungnam 641-773, Korea

S

Sang Su Kim

Changwon National University Department of Physics, , Changwon Kyungnam 641-773, Korea

W

Won-Jeong Kim

Changwon National University Department of Physics, , Changwon Kyungnam 641-773, Korea

A

Amar S. Bhalla

The Pennsylvania State University 187 Materials Research Laboratory, , University Park, Pennsylvania 16802

R

Ruyan Guo

The Pennsylvania State University 187 Materials Research Laboratory, , University Park, Pennsylvania 16802

Cite This Article

Jong Kuk Kim, Sang Su Kim, Won-Jeong Kim, et al. (2006). Enhanced ferroelectric properties of Cr-doped BiFeO3 thin films grown by chemical solution deposition. Applied Physics Letters, 88(13). https://doi.org/10.1063/1.2189453

Enhanced ferroelectric properties of Cr-doped BiFeO3 thin films grown by chemical solution deposition

You May Also Like