Arbitrary EEDF determination of atmospheric-pressure plasma by applying machine learning to OES measurement

Thijs van der Gaag; Hiroshi Onishi; Hiroshi Akatsuka

doi:10.1063/5.0023928

journal article Mar 01, 2021

Arbitrary EEDF determination of atmospheric-pressure plasma by applying machine learning to OES measurement

Thijs van der Gaag

Hiroshi Onishi Hiroshi Akatsuka

Physics of Plasmas Vol. 28 No. 3 · AIP Publishing

View at Publisher Save 10.1063/5.0023928

Abstract

A new method to determine the arbitrary electron energy distribution function (EEDF) from the optical emission spectroscopic measurement in atmospheric-pressure plasma is introduced. The optical emission spectroscopy (OES) continuum emission spectrum, dominated by electron-neutral bremsstrahlung radiation, is analyzed to inspect the usefulness of the conventional OES measurement range for EEDF determination. The EEDF is reconstructed from the OES continuum radiation spectrum by applying machine learning to solve the bremsstrahlung emissivity equation inversely. Through iterative statistical analysis, the presented genetic algorithm can locate the EEDF reliably. Verification of the algorithm shows that theoretical Maxwellian and Druyvesteynian EEDFs can be partially reconstructed from a realistic OES measurement range. Furthermore, preliminary experimental EEDF results of an argon dielectric barrier discharge (DBD) OES measurement are given. The electron energy range and resolution of the determined EEDF are discussed. The results in this paper show potential for accurate determination of the arbitrary EEDF in atmospheric-pressure plasma using simple OES equipment.

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Citations

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References

Details

Published: Mar 01, 2021
Vol/Issue: 28(3)

Authors

T

Thijs van der Gaag

Tokyo Institute of Technology , 2-12-1-N1-10 Ookayama, Meguro-ku, Tokyo 152-8550, Japan

H

Hiroshi Onishi

Tokyo Institute of Technology , 2-12-1-N1-10 Ookayama, Meguro-ku, Tokyo 152-8550, Japan

H

Hiroshi Akatsuka

Tokyo Institute of Technology , 2-12-1-N1-10 Ookayama, Meguro-ku, Tokyo 152-8550, Japan

Funding

Japan Society for the Promotion of Science Award: JP19H01867

Cite This Article

Thijs van der Gaag, Hiroshi Onishi, Hiroshi Akatsuka (2021). Arbitrary EEDF determination of atmospheric-pressure plasma by applying machine learning to OES measurement. Physics of Plasmas, 28(3). https://doi.org/10.1063/5.0023928

Arbitrary EEDF determination of atmospheric-pressure plasma by applying machine learning to OES measurement

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