Resonant x-ray emission spectroscopy at theL3edge of americium up to 23 GPa

S. Heathman; J.-P. Rueff; L. Simonelli; M. A. Denecke; J.-C. Griveau; R. Caciuffo; G. H. Lander

doi:10.1103/physrevb.82.201103

journal article Nov 12, 2010

Resonant x-ray emission spectroscopy at theL3edge of americium up to 23 GPa

S. Heathman J.-P. Rueff L. Simonelli M. A. Denecke J.-C. Griveau R. Caciuffo

G. H. Lander

Physical Review B Vol. 82 No. 20 · American Physical Society (APS)

View at Publisher Save 10.1103/physrevb.82.201103

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Published: Nov 12, 2010
Vol/Issue: 82(20)
License: View

Authors

The University of Manchester, Dalton Nuclear Institute 4 , Manchester, United Kingdom

Cite This Article

S. Heathman, J.-P. Rueff, L. Simonelli, et al. (2010). Resonant x-ray emission spectroscopy at theL3edge of americium up to 23 GPa. Physical Review B, 82(20). https://doi.org/10.1103/physrevb.82.201103

Resonant x-ray emission spectroscopy at theL3edge of americium up to 23 GPa

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