Mechanism of current collapse removal in field-plated nitride HFETs
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J. Li, S.J. Cai, G.Z. Pan et al.
S. Karmalkar, Jianyu Deng, M.S. Shur
B. Gelmont, M. Shur, C. Moglesture
- Published
- Oct 01, 2005
- Vol/Issue
- 26(10)
- Pages
- 704-706
- License
- View
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