Intrinsic Noise and Temperature Coefficients of Selected Voltage References

R. Fleddermann; M. Trobs; F. Steier; G. Heinzel; K. Danzmann

doi:10.1109/tim.2008.2006133

journal article Jun 01, 2009

Intrinsic Noise and Temperature Coefficients of Selected Voltage References

R. Fleddermann M. Trobs F. Steier G. Heinzel K. Danzmann

IEEE Transactions on Instrumentation and Measurement Vol. 58 No. 6 pp. 2002-2007 · Institute of Electrical and Electronics Engineers (IEEE)

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Details

Published: Jun 01, 2009
Vol/Issue: 58(6)
Pages: 2002-2007
License: View

Authors

Albert-Einstein-Institut

K

K. Danzmann

Leibniz Universität Hannover; Albert-Einstein-Institut

Cite This Article

R. Fleddermann, M. Trobs, F. Steier, et al. (2009). Intrinsic Noise and Temperature Coefficients of Selected Voltage References. IEEE Transactions on Instrumentation and Measurement, 58(6), 2002-2007. https://doi.org/10.1109/tim.2008.2006133

Intrinsic Noise and Temperature Coefficients of Selected Voltage References

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