Mutual Information-Based Supervised Attribute Clustering for Microarray Sample Classification

P. Maji

doi:10.1109/tkde.2010.210

journal article Jan 01, 2012

Mutual Information-Based Supervised Attribute Clustering for Microarray Sample Classification

IEEE Transactions on Knowledge and Data Engineering Vol. 24 No. 1 pp. 127-140 · Institute of Electrical and Electronics Engineers (IEEE)

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Published: Jan 01, 2012
Vol/Issue: 24(1)
Pages: 127-140
License: View

Authors

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P. Maji

Cite This Article

P. Maji (2012). Mutual Information-Based Supervised Attribute Clustering for Microarray Sample Classification. IEEE Transactions on Knowledge and Data Engineering, 24(1), 127-140. https://doi.org/10.1109/tkde.2010.210

Mutual Information-Based Supervised Attribute Clustering for Microarray Sample Classification

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