Phase Contrast X-Ray Imaging Signatures for Security Applications

Erin A. Miller; Timothy A. White; Benjamin S. McDonald; Allen Seifert

doi:10.1109/tns.2012.2227803

journal article Feb 01, 2013

Phase Contrast X-Ray Imaging Signatures for Security Applications

Erin A. Miller Timothy A. White Benjamin S. McDonald Allen Seifert

IEEE Transactions on Nuclear Science Vol. 60 No. 1 pp. 416-422 · Institute of Electrical and Electronics Engineers (IEEE)

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Metrics

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Citations

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References

Details

Published: Feb 01, 2013
Vol/Issue: 60(1)
Pages: 416-422
License: View

Authors

Cite This Article

Erin A. Miller, Timothy A. White, Benjamin S. McDonald, et al. (2013). Phase Contrast X-Ray Imaging Signatures for Security Applications. IEEE Transactions on Nuclear Science, 60(1), 416-422. https://doi.org/10.1109/tns.2012.2227803

Phase Contrast X-Ray Imaging Signatures for Security Applications

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