Imaging of nonlocal hot-electron energy dissipation via shot noise

Qianchun Weng; Susumu Komiyama; Le Yang; Zhenghua An; Pingping Chen; Svend-Age Biehs; Yusuke Kajihara; Wei Lu

doi:10.1126/science.aam9991

journal article May 18, 2018

Imaging of nonlocal hot-electron energy dissipation via shot noise

Qianchun Weng

Susumu Komiyama Le Yang

Science Vol. 360 No. 6390 pp. 775-778 · American Association for the Advancement of Science (AAAS)

View at Publisher Save 10.1126/science.aam9991

Abstract

Taking the temperature of hot electrons

As electronic chips become smaller, efficient heat dissipation becomes a greater challenge. Electrons in such devices quickly accelerate over small distances, becoming “hot”—that is, out of equilibrium with the rest of the system. Weng
et al.
designed a thermometry probe that measures the effective temperature of hot electrons with a spatial resolution of about 50 nanometers. The method is based on the optical measurement of current noise and provides a glimpse into where heat is naturally dissipated in a working device.

Science
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Details

Published: May 18, 2018
Vol/Issue: 360(6390)
Pages: 775-778

Authors

Q

Qianchun Weng

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, The Chinese Academy of Sciences, Shanghai 200083, PR China.; Institute of Industrial Science, The University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo, 153-8505, Japan.

S

Susumu Komiyama

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, The Chinese Academy of Sciences, Shanghai 200083, PR China.; Department of Basic Science, The University of Tokyo, Komaba 3-8-1, Meguro-ku, Tokyo, 153-8902, Japan.

L

Le Yang

State Key Laboratory of Surface Physics, Institute for Nanoelectronic Devices and Quantum Computing, and Key Laboratory of Micro and Nano Photonics Structures (Ministry of Education), Department of Physics, Fudan University, Shanghai 200433, PR China.

Z

Zhenghua An

State Key Laboratory of Surface Physics, Institute for Nanoelectronic Devices and Quantum Computing, and Key Laboratory of Micro and Nano Photonics Structures (Ministry of Education), Department of Physics, Fudan University, Shanghai 200433, PR China.; Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093, PR China.

P

Pingping Chen

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, The Chinese Academy of Sciences, Shanghai 200083, PR China.

S

Svend-Age Biehs

Institut für Physik, Carl von Ossietzky Universität, D-26111 Oldenburg, Germany.

Y

Yusuke Kajihara

Institute of Industrial Science, The University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo, 153-8505, Japan.

W

Wei Lu

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, The Chinese Academy of Sciences, Shanghai 200083, PR China.

Funding

National Natural Science Foundation of China Award: 11427807/11634012/11674070

National Key Research Program of China Award: 2016YFA0302000

Shanghai Science and Technology Committee Award: 16JC1400400

Chinese Academy of Sciences Visiting Professorships for Senior International Scientists

Cite This Article

Qianchun Weng, Susumu Komiyama, Le Yang, et al. (2018). Imaging of nonlocal hot-electron energy dissipation via shot noise. Science, 360(6390), 775-778. https://doi.org/10.1126/science.aam9991

Imaging of nonlocal hot-electron energy dissipation via shot noise

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