Light‐Deflection Errors in the Interferometry of Electrochemical Mass Transfer Boundary Layers

F. R. McLarnon; R. H. Müller; C. W. Tobias

doi:10.1149/1.2134159

journal article Jan 01, 1975

Light‐Deflection Errors in the Interferometry of Electrochemical Mass Transfer Boundary Layers

F. R. McLarnon R. H. Müller C. W. Tobias

Journal of The Electrochemical Society Vol. 122 No. 1 pp. 59-64 · The Electrochemical Society

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Published: Jan 01, 1975
Vol/Issue: 122(1)
Pages: 59-64
License: View

Authors

F

F. R. McLarnon

Inorganic Materials Research Division, Lawrence Berkeley Laboratory, and Department of Chemical Engineering, University of California, Berkeley, California 94720

R

R. H. Müller

Inorganic Materials Research Division, Lawrence Berkeley Laboratory, and Department of Chemical Engineering, University of California, Berkeley, California 94720

C

C. W. Tobias

Inorganic Materials Research Division, Lawrence Berkeley Laboratory, and Department of Chemical Engineering, University of California, Berkeley, California 94720

Cite This Article

F. R. McLarnon, R. H. Müller, C. W. Tobias (1975). Light‐Deflection Errors in the Interferometry of Electrochemical Mass Transfer Boundary Layers. Journal of The Electrochemical Society, 122(1), 59-64. https://doi.org/10.1149/1.2134159

Light‐Deflection Errors in the Interferometry of Electrochemical Mass Transfer Boundary Layers

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