journal article Aug 01, 1994

Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Kyu-Haeng Lee Wook-Rae Cho Jung-Ho Park Jong-Sup Kim Seung-Han Park Ung Kim

Optics Letters Vol. 19 No. 15 pp. 1116 · Optica Publishing Group

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Citations

10

References

Details

Published: Aug 01, 1994
Vol/Issue: 19(15)
Pages: 1116
License: View

Authors

Department of Biochemistry, Center for Advanced Biotechnology and Medicine, Robert Wood Johnson Medical School, Piscataway, New Jersey 08854;

Cite This Article

Kyu-Haeng Lee, Wook-Rae Cho, Jung-Ho Park, et al. (1994). Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser. Optics Letters, 19(15), 1116. https://doi.org/10.1364/ol.19.001116

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