A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping

Piero Toscano; Annamaria Castrignanò; Salvatore Di Gennaro; Alessandro Vittorio Vonella; Domenico Ventrella; Alessandro Matese

doi:10.3390/agronomy9080437

journal article Open Access Aug 08, 2019

A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping

Piero Toscano

Annamaria Castrignanò Salvatore Di Gennaro

Alessandro Vittorio Vonella Domenico Ventrella

Alessandro Matese

Agronomy Vol. 9 No. 8 pp. 437 · MDPI AG

View at Publisher Save 10.3390/agronomy9080437

Abstract

The availability of big data in agriculture, enhanced by free remote sensing data and on-board sensor-based data, provides an opportunity to understand within-field and year-to-year variability and promote precision farming practices for site-specific management. This paper explores the performance in durum wheat yield estimation using different technologies and data processing methods. A state-of-the-art data cleaning technique has been applied to data from a yield monitoring system, giving a good agreement between yield monitoring data and hand sampled data. The potential use of Sentinel-2 and Landsat-8 images in precision agriculture for within-field production variability is then assessed, and the optimal time for remote sensing to relate to durum wheat yield is also explored. Comparison of the Normalized Difference Vegetation Index(NDVI) with yield monitoring data reveals significant and highly positive linear relationships (r ranging from 0.54 to 0.74) explaining most within-field variability for all the images acquired between March and April. Remote sensing data analyzed with these methods could be used to assess durum wheat yield and above all to depict spatial variability in order to adopt site-specific management and improve productivity, save time and provide a potential alternative to traditional farming practices.

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Details

Published: Aug 08, 2019
Vol/Issue: 9(8)
Pages: 437
License: View

Authors

P

Piero Toscano

Institute of BioEconomy (IBE), National Research Council (CNR), Via Caproni 8, 50145 Florence, Italy

A

Annamaria Castrignanò

Council for Agricultural Research and Economics, Research Centre for Agriculture and Environment (CREA-AA), Via Celso Ulpiani 5, 70125 Bari, Italy

S

Salvatore Di Gennaro

Institute of BioEconomy (IBE), National Research Council (CNR), Via Caproni 8, 50145 Florence, Italy

A

Alessandro Vittorio Vonella

Council for Agricultural Research and Economics, Research Centre for Agriculture and Environment (CREA-AA), Via Celso Ulpiani 5, 70125 Bari, Italy

D

Domenico Ventrella

Council for Agricultural Research and Economics, Research Centre for Agriculture and Environment (CREA-AA), Via Celso Ulpiani 5, 70125 Bari, Italy

A

Alessandro Matese

Institute of BioEconomy (IBE), National Research Council (CNR), Via Caproni 8, 50145 Florence, Italy

Funding

Italian P.O.N. “Ricerca e competitività” 2007-2013 for convergence Regions Award: CTN01_00230_450760

Cite This Article

Piero Toscano, Annamaria Castrignanò, Salvatore Di Gennaro, et al. (2019). A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping. Agronomy, 9(8), 437. https://doi.org/10.3390/agronomy9080437

A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping

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