Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

Gabriela B. González

doi:10.3390/ma5050818

journal article Open Access May 11, 2012

Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

Gabriela B. González

Materials Vol. 5 No. 5 pp. 818-850 · MDPI AG

View at Publisher Save 10.3390/ma5050818

Abstract

Transparent conducting oxide (TCO) materials are implemented into a wide variety of commercial devices because they possess a unique combination of high optical transparency and high electrical conductivity. Created during the processing of the TCOs, defects within the atomic-scale structure are responsible for their desirable optical and electrical properties. Therefore, studying the defect structure is essential to a better understanding of the behavior of transparent conductors. X-ray and neutron scattering techniques are powerful tools to investigate the atomic lattice structural defects in these materials. This review paper presents some of the current developments in the study of structural defects in n-type TCOs using x-ray diffraction (XRD), neutron diffraction, extended x-ray absorption fine structure (EXAFS), pair distribution functions (PDFs), and x-ray fluorescence (XRF).

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References

97

[1]

Chopra "Transparent conductors-a status review" Thin Solid Films (1988) 10.1016/0040-6090(83)90256-0

[2]

Ginley "Transparent conducting oxides" MRS Bulletin (2000) 10.1557/mrs2000.256

[3]

Warschkow "Defect cluster aggregation and nonreducibility in tin-doped indium oxide" J. Am. Ceram. Soc. (2003) 10.1111/j.1151-2916.2003.tb03544.x

[4]

Frank "Electrical properties and defect model of tin-doped indium oxide layers" Appl. Phys. A Mat. Sci. Process. (1982) 10.1007/bf00619080

[5]

Lany "Dopability, Intrinsic conductivity, and nonstoichiometry of transparent conducting oxides" Phys. Rev. Lett. (2007) 10.1103/physrevlett.98.045501

[6]

"Hydrogen as a cause of doping in zinc oxide" Phys. Rev. Lett. (2000) 10.1103/physrevlett.85.1012

[7]

Erhart "First-principles study of the structure and stability of oxygen defects in zinc oxide" Phys. Rev. B (2005) 10.1103/physrevb.72.085213

[8]

Erhart "First-principles study of intrinsic point defects in ZnO: Role of band structure, volume relaxation, and finite-size effects" Phys. Rev. B (2006) 10.1103/physrevb.73.205203

[9]

Kohan "First-principles study of native point defects in ZnO" Phys. Rev. B (2000) 10.1103/physrevb.61.15019

[10]

Warren "The diffraction of x-rays in glass" Phys. Rev. (1934) 10.1103/physrev.45.657

[11]

Klug, H.P., and Alexander, L.E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, John Wiley & Sons. [2nd ed.].

[12]

Petkov "Element-specific structure of materials with intrinsic disorder by high-energy resonant x-ray diffraction and differential atomic pair-distribution functions: A study of PtPd nanosized catalysts" Phys. Rev. B (2010) 10.1103/physrevb.81.165428

[13]

Petkov "Polyhedral units and network connectivity in calcium aluminosilicate glasses from high-energy x-ray diffraction" Phys. Rev. Lett. (2010) 10.1103/physrevlett.85.3436

[14]

Marezio "Refinement of the crystal structure of In2O3 at two wavelengths" Acta Crystallogr. (1966) 10.1107/s0365110x66001749

[15]

Wilson, A.J.C. (1992). The International Union of Crystallography, International Tables for Crystallography, Kluwer Academic Publishers.

[16]

"Structural aspects and defect chemistry in In2O3" J. Solid State Chem. (1973)

[17]

"The high temperature behavior of In2O3" J. Solid State Chem. (1975) 10.1016/0022-4596(75)90118-8

[18]

"Electrical properties of In2O3" J. Solid State Chem. (1977)

[19]

Lahey "Electron concentration and mobility in In2O3" J. Solid State Chem. (1977) 10.1016/0022-3697(77)90117-2

[20]

Okasinski "In situ studies on the kinetics of formation and crystal structure of In4Sn3O12 using high-energy x-ray diffraction" J. Appl. Phys. (2008)

[21]

Mason "Determination of the solubility of tin in indium oxide using in situ and ex situ x-ray diffraction" J. Am. Ceram. Soc. (2012) 10.1111/j.1551-2916.2011.04999.x

[22]

González, G.B. (2003). Studies on the Defect Structure of Indium-Tin Oxide Using X-ray and Neutron Diffraction. [Ph.D. Dissertation, Northwestern University].

[23]

Mason "Defect structure studies of bulk and nano-indium-tin oxide" J. Appl. Phys. (2004) 10.1063/1.1783610

[24]

Cohen "Neutron diffraction study on the defect structure of indium-tin oxide" J. Appl. Phys. (2001) 10.1063/1.1341209

[25]

Parent "Structural study of tin-doped indium oxide thin films using x-ray absorption spectroscopy and x-ray diffraction I. Description of the indium site" J. Electrochem. Soc. (1992) 10.1149/1.2069184

[26]

Parent "Structural study of tin-doped indium oxide thin films using x-ray absorption spectroscopy and x-ray diffraction II. Tin environment" J. Electrochem. Soc. (1992) 10.1149/1.2069185

[27]

Nadaud "Structural studies of tin-doped indium oxide (ITO) and In4Sn3O12" J. Solid State Chem. (1998) 10.1006/jssc.1997.7613

[28]

Rietveld "A profile refinement method for nuclear and magnetic structure" J. Appl. Crystallogr. (1969) 10.1107/s0021889869006558

[29]

Warschkow "Defect structures of tin-doped indium oxide" J. Am. Ceram. Soc. (2003) 10.1111/j.1151-2916.2003.tb03543.x

[30]

Warschkow "Interstitial oxygen in tin-doped indium oxide transparent conductors" J. Am. Ceram. Soc. (2006) 10.1111/j.1551-2916.2005.00708.x

[31]

Inerbaev "Interstitial oxygen and dopant atoms arrangement in tin-doped indium oxide" Mater. Trans. (2007) 10.2320/matertrans.48.666

[32]

Inerbaev "Reducible and non-reducible defect clusters in tin-doped indium oxide" Solid State Comm. (2010) 10.1016/j.ssc.2009.10.016

[33]

Phillips "Zinc-indium-oxide: A high conductivity transparent conducting oxide" Appl. Phys. Lett. (1995) 10.1063/1.115118

[34]

Palmer "Zn2−xSn1−xIn2xO4−δ: An indium-substituted spinel with transparent conducting properties" J. Solid State Chem. (1997) 10.1006/jssc.1997.7576

[35]

Palmer "Conductivity and transparency of ZnO/SnO2-cosubstituted In2O3" Chem. Mater. (1997) 10.1021/cm9704037

[36]

Palmer, G.B. (1999). Phase Relations and Physical Properties in the (Indium, Gallium)-Tin-Zinc Oxide Systems. [Ph.D. Dissertation, Northwestern University].

[37]

Ambrosini "Zinc codoping in cosubstituted In2−2xSnxZnxO3−δ" Chem. Mater. (2002) 10.1021/cm010073x

[38]

Bizo "The great potential of coupled substitutuions in In2O3 for the generation of bixbyite-type transparent conducting oxides, In2−2xMxSnxO3" Solid State Commun. (2005) 10.1016/j.ssc.2005.07.009

[39]

Seo "Co-doping effect of SnO2 and ZnO in In2O3 ceramics: Change in solubility limit and electrical properties" J. Solid State Ionics (2006) 10.1016/j.ssi.2005.12.020

[40]

Harvey "Carrier generation and inherent off-stoichiometry in Zn, Sn codoped indium oxide (ZITO) bulk and thin-film specimens" J. Am. Ceram. Soc. (2008) 10.1111/j.1551-2916.2007.02135.x

[41]

Harvey "Subsolidous phase relationships in the ZnO-In2O3-SnO2 system" J. Am. Ceram. Soc. (2008) 10.1111/j.1551-2916.2008.02686.x

[42]

Harvey "Bulk defect chemistry and surface electronic behavior of Zn, Sn codoped In2O3 transparent conducting oxides" Phys. Chem. Phys. (2009) 10.1039/b822149a

[43]

Hoel "Probing the local structure of crystalline ZITO: In2−2xSnxZnxO3 (x ≤ 0.4)" J. Solid State Chem. (2010) 10.1016/j.jssc.2010.01.014

[44]

Hoel "High-pressure synthesis and local structure of corundum-type In2−2xZnxO3 (x ≤ 0.7)" J. Am. Chem. Soc. (2010) 10.1021/ja106048x

[45]

Hoel "Transparent conducting oxides in the ZnO-In2O3-SnO2 system" Chem. Mater. (2010) 10.1021/cm1004592

[46]

Hoel "Evidence for Tetrahedral Zinc in Amorphous In2−2xZnxSnxO3 (a-ZITO)" J. Inorg. Gen. Chem. (2011)

[47]

Proffit "X-ray absorption spectroscopy study of the local structures of crystalline Zn-In-Sn oxide thin films" J. Appl. Phys. (2009) 10.1063/1.3259385

[48]

Proffit, D.E. (2011). Structure and Electronic Properties of Crystalline and Amorphous Zn-In-Sn-O Thin Films. [Ph.D. Dissertation, Northwestern University].

[49]

Buchholz "Control and characterization of the structural, electrical, and optical properties of amorphous zinc-indium-tin oxide thin films" ACS Appl. Mater. Interfaces (2009) 10.1021/am900321f

[50]

Adurodija "Crystallization process and electro-optical properties of In2O3 and ITO thin films" J. Mater. Sci. (2006) 10.1007/s10853-006-0038-3

Showing 50 of 97 references

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Details

Published: May 11, 2012
Vol/Issue: 5(5)
Pages: 818-850
License: View

Authors

G

Gabriela B. González

Department of Physics, DePaul University, 2219 N. Kenmore Avenue, Chicago, IL 60614, USA

Cite This Article

Gabriela B. González (2012). Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques. Materials, 5(5), 818-850. https://doi.org/10.3390/ma5050818

Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

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