J

Researcher Profile

Jonghyun Go

🏛 Semiconductor Research and Development Center, Samsung Electronics, Hwaseong-si, Gyeonggi-do, Republic of Korea

2

Publications

43

Citations

10

Co-Authors

2

Active Years

Publications

Journal Article IEEE Journal of Solid-State Circuits Apr 01, 2026

A 1.16 e-rms Temporal Random Noise, 123-dB High Dynamic Range, 2.988- μ m Pitch 3-Mpixel Three-Stacked Digital Pixel Sensor for Versatile Applications

Min-Woong Seo · Yong-Suk Choi · Sanggwon Lee · Yeongseok Shim +23 more

10.1109/jssc.2026.3663214

Journal Article IEEE Journal of Solid-State Circuits Apr 01, 2022

2.45 e-RMS Low-Random-Noise, 598.5 mW Low-Power, and 1.2 kfps High-Speed 2-Mp Global Shutter CMOS Image Sensor With Pixel-Level ADC and Memory

Min-Woong Seo · Myunglae Chu · Hyun-Yong Jung · Suksan Kim +20 more

10.1109/jssc.2022.3142436 43 citations

Publication Timeline

2026

1

2022

1

Frequent Co-Authors