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Researcher Profile

Max Schulz

🏛 Institute of Applied Physics, University of Erlangen–Nuremberg, Staudtstrasse 7, D-91058 Erlangen, Germany

1

Publications

9

Citations

4

Co-Authors

1

Active Years

Publications

Journal Article Applied Physics Letters Jan 21, 2002

Analysis of photoexcited charge carrier density profiles in Si wafers by using an infrared camera

Rolf Brendel · Michael Bail · Benno Bodmann · Jörg Kentsch +1 more

10.1063/1.1434308 9 citations

Publication Timeline

2002

1

Frequent Co-Authors