journal article Aug 23, 2011

Resistive‐Switching Crossbar Memory Based on Ni–NiO Core–Shell Nanowires

Small Vol. 7 No. 20 pp. 2899-2905 · Wiley
View at Publisher Save 10.1002/smll.201101157
Abstract
AbstractResistive‐switching memory (RRAM) is an emerging nanoscale device based on the localized metal–insulator transition within a few‐nanometer‐sized metal oxide region. RRAM is one of the most promising memory technologies for the ultimate downscaling of nonvolatile memory. However, to develop memory arrays with densities approaching 1 Tb cm−2, bottom‐up schemes based on synthesis and assembly of metal oxide nanowires (NWs) must be demonstrated. A RRAM memory device based on core–shell Ni‐NiO NWs is presented, in which the Ni core plays the role of the metallic interconnect, while the NiO shell serves as the active switching layer. A resistance change of at least two orders of magnitude is shown on electrical operation of the device, and the metal–insulator switching is unequivocally demonstrated to take place in the NiO shell at the crossing between two NWs or between a NW and a gold electrode strip. Since the fabrication of the NW crossbar device is not limited by lithography, this approach may provide a basis for high‐density, low‐cost crossbar memory with long‐term storage stability.
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Cited By
78
Memristive devices for computing

J. Joshua Yang, Dmitri B. Strukov · 2012

Nature Nanotechnology
Metrics
78
Citations
30
References
Details
Published
Aug 23, 2011
Vol/Issue
7(20)
Pages
2899-2905
License
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Cite This Article
Carlo Cagli, Federico Nardi, Bruce Harteneck, et al. (2011). Resistive‐Switching Crossbar Memory Based on Ni–NiO Core–Shell Nanowires. Small, 7(20), 2899-2905. https://doi.org/10.1002/smll.201101157
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