Failure and degradation mechanisms of high-power white light emitting diodes

Shih-Chun Yang; Pang Lin; Chien-Ping Wang; Sheng Bang Huang; Chiu-Ling Chen; Pei-Fang Chiang; An-Tse Lee; Mu-Tao Chu

doi:10.1016/j.microrel.2010.03.007

journal article Jul 01, 2010

Failure and degradation mechanisms of high-power white light emitting diodes

Shih-Chun Yang Pang Lin Chien-Ping Wang Sheng Bang Huang Chiu-Ling Chen Pei-Fang Chiang An-Tse Lee Mu-Tao Chu

Microelectronics Reliability Vol. 50 No. 7 pp. 959-964 · Elsevier BV

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Published: Jul 01, 2010
Vol/Issue: 50(7)
Pages: 959-964
License: View

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Cite This Article

Shih-Chun Yang, Pang Lin, Chien-Ping Wang, et al. (2010). Failure and degradation mechanisms of high-power white light emitting diodes. Microelectronics Reliability, 50(7), 959-964. https://doi.org/10.1016/j.microrel.2010.03.007

Failure and degradation mechanisms of high-power white light emitting diodes

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