Sensitive measurement of optical nonlinearities using a single beam

M. Sheik-bahae; A.A. Said; T.-H. Wei; D.J. Hagan; E.W. Van Stryland

doi:10.1109/3.53394

journal article Apr 01, 1990

Sensitive measurement of optical nonlinearities using a single beam

M. Sheik-bahae A.A. Said T.-H. Wei D.J. Hagan E.W. Van Stryland

IEEE Journal of Quantum Electronics Vol. 26 No. 4 pp. 760-769 · Institute of Electrical and Electronics Engineers (IEEE)

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Published: Apr 01, 1990
Vol/Issue: 26(4)
Pages: 760-769
License: View

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Cite This Article

M. Sheik-bahae, A.A. Said, T.-H. Wei, et al. (1990). Sensitive measurement of optical nonlinearities using a single beam. IEEE Journal of Quantum Electronics, 26(4), 760-769. https://doi.org/10.1109/3.53394

Sensitive measurement of optical nonlinearities using a single beam

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