System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

O. A. Kalashnikov; P. V. Nekrasov; A. Yu. Nikiforov; V. A. Telets; G. V. Chukov; V. V. Elesin

doi:10.1134/s1063739716010066

journal article Jan 01, 2016

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

O. A. Kalashnikov P. V. Nekrasov A. Yu. Nikiforov V. A. Telets G. V. Chukov V. V. Elesin

Russian Microelectronics Vol. 45 No. 1 pp. 33-40 · Pleiades Publishing Ltd

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Published: Jan 01, 2016
Vol/Issue: 45(1)
Pages: 33-40
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Cite This Article

O. A. Kalashnikov, P. V. Nekrasov, A. Yu. Nikiforov, et al. (2016). System-on-chip: Specifics of radiation behavior and estimation of radiation hardness. Russian Microelectronics, 45(1), 33-40. https://doi.org/10.1134/s1063739716010066

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

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