S

Researcher Profile

Sejune Cheon

0000-0001-6179-3217

1

Publications

274

Citations

3

Co-Authors

1

Active Years

Publications

Journal Article IEEE Transactions on Semiconductor Manufacturing May 01, 2019

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Sejune Cheon · Hankang Lee · Chang Ouk Kim · Seok Hyung Lee

10.1109/tsm.2019.2902657 274 citations

Publication Timeline

2019

1

Frequent Co-Authors