journal article Dec 01, 2011

An explicit multi-exponential model for semiconductor junctions with series and shunt resistances

Microelectronics Reliability Vol. 51 No. 12 pp. 2044-2048 · Elsevier BV
View at Publisher Save 10.1016/j.microrel.2011.06.030
Topics

No keywords indexed for this article. Browse by subject →

References
22
[1]
Ortiz-Conde "Approximate analytical expression for equation of ideal diode with series and shunt resistances" Electron Lett (1992) 10.1049/el:19921259
[2]
He "A new analytic approximation to general diode equation" Solid State Electron (2006) 10.1016/j.sse.2006.06.013
[3]
Corless "On the Lambert W function" Adv Comput Math (1996) 10.1007/bf02124750
[4]
Exact analytical solution for current flow throughdiode with series resistance

T.C. Banwell, A. Jayakumar

Electronics Letters 2000 10.1049/el:20000301
[5]
Ortiz-Conde "Exact analytical solutions of the forward non-ideal diode equation with series and shunt parasitic resistances" Solid State Electron (2000) 10.1016/s0038-1101(00)00132-5
[6]
Ortiz-Conde "Extraction of non-ideal junction model parameters from the explicit analytic solutions of its I–V characteristics" Solid State Electron (2005) 10.1016/j.sse.2004.12.001
[7]
Bayhan "Exact analytical solution of the diode ideality factor of a pn junction device using Lambert W-function model" Turkish J Phys (2007)
[8]
Jung "Schottky diode parameters extraction using Lambert W function" Mater Sci Eng B: Solid State Mater Adv Technol (2009) 10.1016/j.mseb.2009.02.013
[9]
Exact analytical solutions of the parameters of real solar cells using Lambert W-function

A Jain

Solar Energy Materials and Solar Cells 2004 10.1016/j.solmat.2003.11.018
[10]
Ortiz-Conde "New method to extract the model parameters of solar cells from the explicit analytic solutions of their illuminated I–V characteristics" Solar Energy Mater Solar Cells (2006) 10.1016/j.solmat.2005.04.023
[11]
Bayhan "Study of CdS/Cu(In, Ga)Se2 interface by using n values extracted analytically from experimental data" Solar Energy (2009) 10.1016/j.solener.2008.08.009
[12]
Hruska P, Chobola Z, Grmela L. Diode I–U curve fitting with Lambert W function. In: Proc 25th intl conf microelectron (MIEL 2006), Belgrade, Serbia & Montenegro, 14–17 May, 2006. p. 501–4.
[13]
Lugo-Muñoz "Parameter extraction in quadratic exponential junction model with series resistance using global lateral fitting" Electrochem Soc Trans (2010)
[14]
Miranda "Equivalent circuit model for the gate leakage current in broken down HfO2/TaN/TiN gate stacks" IEEE Electron Dev Lett (2008) 10.1109/led.2008.2006413
[15]
de Souza M, Rue B, Flandre D, Pavanello MA. Thermal sensing performance of lateral SOI PIN diodes in the 90–400K Range. In: Proc IEEE int SOI conf, 5–8 October, 2009. p. 1–2. 10.1109/soi.2009.5318770
[16]
Nishioka "Analysis of the temperature characteristics in polycrystalline Si solar cells using modified equivalent circuit model" Jpn J Appl Phys (2003) 10.1143/jjap.42.7175
[17]
Kurobe "New two-diode model for detailed analysis of multicrystalline silicon solar cells" Jap J Appl Phys (2005) 10.1143/jjap.44.8314
[18]
Analysis of multicrystalline silicon solar cells by modified 3-diode equivalent circuit model taking leakage current through periphery into consideration

Kensuke Nishioka, Nobuhiro Sakitani, Yukiharu Uraoka et al.

Solar Energy Materials and Solar Cells 2007 10.1016/j.solmat.2007.04.009
[19]
Kassis "Analysis of multicrystalline silicon solar cells at low illumination levels using a modified two-diode model" Solar Energy Mater Solar Cells (2010) 10.1016/j.solmat.2010.06.036
[20]
Bouzidi "Solar cells parameters evaluation considering the series and shunt resistance" Solar Energy Mater Solar Cells (2007) 10.1016/j.solmat.2007.05.019
[21]
Wong "A robust parameter extraction method for diode with series resistance" IEEE Hong Kong Electron Dev Meet (2001)
[22]
Sandrolini "Numerical method for the extraction of photovoltaic module double-diode model parameters through cluster analysis" Appl Energy (2009) 10.1016/j.apenergy.2009.07.022
Metrics
30
Citations
22
References
Details
Published
Dec 01, 2011
Vol/Issue
51(12)
Pages
2044-2048
License
View
Cite This Article
Denise Lugo-Muñoz, Juan Muci, Adelmo Ortiz-Conde, et al. (2011). An explicit multi-exponential model for semiconductor junctions with series and shunt resistances. Microelectronics Reliability, 51(12), 2044-2048. https://doi.org/10.1016/j.microrel.2011.06.030
Related

You May Also Like