Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

T. R. Albrecht; P. Grütter; D. Horne; D. Rugar

doi:10.1063/1.347347

journal article Jan 15, 1991

Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

T. R. Albrecht P. Grütter D. Horne D. Rugar

Journal of Applied Physics Vol. 69 No. 2 pp. 668-673 · AIP Publishing

View at Publisher Save 10.1063/1.347347

Abstract

A new frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum (&lt;10−3 Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional ‘‘slope detection,’’ the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q∼50 000) versus slope detection in air (Q∼100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin-film CoPtCr magnetic disk. In the future, the increased sensitivity offered by this technique should extend the range of problems accessible by force microscopy.

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Details

Published: Jan 15, 1991
Vol/Issue: 69(2)
Pages: 668-673

Authors

T

T. R. Albrecht

IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120

P

P. Grütter

IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120

D

D. Horne

IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120

D

D. Rugar

IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120

Cite This Article

T. R. Albrecht, P. Grütter, D. Horne, et al. (1991). Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. Journal of Applied Physics, 69(2), 668-673. https://doi.org/10.1063/1.347347

Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

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